Traditional root cause analysis in manufacturing uses summary data, which is ineffective in the face of complex issues stemming from subtle defects in a process.
September 13, 2018 Sponsored by Keysight Technologies. Date and time TBD As the industry moves to 10nm and 7nm nodes, advances in wafer processing — etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others — will be required.
In addition, as reliability verification needs expand, customer demand drives the development and qualification of new and augmented reliability rules. For many, formal reliability verification is a new process.
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Keysight's Parametric Measurement Handbook Rev 4 Keysight Technologies' popular 276-page Parametric Measurement Handbook is an invaluable reference tool for anyone performing device or process characterization.
Foundry-qualified and foundry-maintained reliability rule decks enable design and IP companies alike to establish baseline robustness and reliability criteria without committing extensive time and resources to the creation and support of proprietary verification solutions.
Keysight Technologies' popular 276-page Parametric Measurement Handbook is an invaluable reference tool for anyone performing device or process characterization. Full trace analytics, backed by powerful Artificial Intelligence A. Ruthenium Nanolayers are Ferromagnetic at RT.
Keysight's Parametric Measurement Handbook Rev 4.